Geometric phase analysis: Difference between revisions
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'''Geometric phase analysis''' is a [[digital signal processing]] method used with [[Fast Fourier transform]] algorithms in [[high-resolution transmission electron microscopy]] images to quantify displacement and strain fields in crystalline lattices at nanoscale resolution.<ref name=Hytch>{{cite journal|title=Quantitative measurement of displacement and strain fields from HREM micrographs|year=1998|first1=M.J.|last1=Hytch|journal=Ultramicroscopy|volume=74|issue=3|doi=10.1016/s0304-3991(98)00035-7|pages=131–146}}</ref><ref>{{cite book |editor1-last=Kumar |editor1-first=Challa S.S.R. |title=Transmission Electron Microscopy Characterization of Nanomaterials |date=2014 |publisher=Springer |isbn=978-3642389337}}</ref> |
'''Geometric phase analysis''' is a [[digital signal processing]] method used with [[Fast Fourier transform]] algorithms in [[high-resolution transmission electron microscopy]] images to quantify displacement and strain fields in crystalline lattices at nanoscale resolution.<ref name=Hytch>{{cite journal|title=Quantitative measurement of displacement and strain fields from HREM micrographs|year=1998|first1=M.J.|last1=Hytch|journal=Ultramicroscopy|volume=74|issue=3|doi=10.1016/s0304-3991(98)00035-7|pages=131–146}}</ref><ref>{{cite book |editor1-last=Kumar |editor1-first=Challa S.S.R. |title=Transmission Electron Microscopy Characterization of Nanomaterials |date=2014 |publisher=Springer |isbn=978-3642389337}}</ref> |
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Revision as of 10:01, 29 January 2021
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Geometric phase analysis is a digital signal processing method used with Fast Fourier transform algorithms in high-resolution transmission electron microscopy images to quantify displacement and strain fields in crystalline lattices at nanoscale resolution.[1][2]
References
- ^ Hytch, M.J. (1998). "Quantitative measurement of displacement and strain fields from HREM micrographs". Ultramicroscopy. 74 (3): 131–146. doi:10.1016/s0304-3991(98)00035-7.
- ^ Kumar, Challa S.S.R., ed. (2014). Transmission Electron Microscopy Characterization of Nanomaterials. Springer. ISBN 978-3642389337.
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