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There is a page named "Field ion microscopy" on Wikipedia
The field-ion microscope (FIM) was invented by Müller in 1951. It is a type of microscope that can be used to image the arrangement of atoms at the surface...9 KB (1,181 words) - 03:03, 18 June 2024
Atom probe (section Field ion microscopy)make definitive identification impossible. Field ion microscopy is a modification of field emission microscopy where a stream of tunneling electrons is...32 KB (4,502 words) - 20:42, 16 May 2024- List of materials analysis methods (redirect from Acronyms in microscopy)– Atomic force microscopy AFS – Atomic fluorescence spectroscopy Analytical ultracentrifugation APFIM – Atom probe field ion microscopy APS – Appearance...14 KB (1,385 words) - 22:11, 8 May 2024
microscopy: feasibility and promise". Scanning Electron Microscopy: 125. W. H. Escovitz; T. R. Fox; R. Levi-Setti (1975). "Scanning Transmission Ion Microscope...26 KB (3,322 words) - 22:07, 2 March 2024- Electron microscope Field ion microscope List of surface analysis methods "Intro to Field Emission". Field Emission / Ion Microscopy Laboratory, Purdue...6 KB (741 words) - 23:18, 12 August 2023
Optical microscopy Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) Field ion microscopy (FIM) Scanning probe microscopy (SPM)...9 KB (753 words) - 16:24, 8 June 2024
Electron microscope (redirect from Electron microscopy)electron microscopy (CLEM) is one of a range of correlative workflows now available. Another example is high resolution mass spectrometry (ion microscopy), which...49 KB (5,605 words) - 07:40, 19 July 2024- Age Hardening in Aluminium Alloys: Atom Probe Field-Ion Microscopy and Transmission Electron Microscopy Studies" (PDF). Archived from the original (PDF)...2 KB (233 words) - 19:00, 28 June 2024
mechanisms and rates, the most important of which are field ion microscopy and scanning tunneling microscopy. While in principle the process can occur on a variety...25 KB (2,940 words) - 18:52, 24 February 2021
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen...118 KB (15,054 words) - 01:20, 9 July 2024
Scanning electron microscope (redirect from Scanning electron microscopy)history of scanning electron microscopy has been presented by McMullan. Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling...66 KB (8,138 words) - 15:40, 28 June 2024
related to Scanning helium ion microscopy. Carl Zeiss SMT – Nano Technology Systems Division: ORION He-Ion microscope Microscopy Today, Volume 14, Number...5 KB (466 words) - 07:06, 21 September 2023
Dislocations can be observed using transmission electron microscopy, field ion microscopy and atom probe techniques. Deep-level transient spectroscopy...20 KB (2,507 words) - 14:12, 15 October 2023- microscopy (TEM). The accurate and damage-free surface ion milling provides makes it perfect for the precise fabrication of semiconductors. Using ion...12 KB (1,329 words) - 11:15, 11 February 2024
- .102..624M. doi:10.1103/PhysRev.102.624. Muller, E. W. (1965). "Field Ion Microscopy". Science. 149 (3684): 591–601. Bibcode:1965Sci...149..591M. doi:10...5 KB (539 words) - 00:25, 12 May 2024
Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. SICM allows for the determination...15 KB (1,986 words) - 15:52, 26 June 2024- Angle resolved photoemission spectroscopy (ARPES) Field emission microscopy and Field ion microscopy Atom Probe Tomography (APT) UHV is necessary for these...22 KB (3,058 words) - 21:00, 10 December 2023
Ernst G. Bauer (section Surface electron microscopy with low energy electrons (LEEM, SPLEEM, SPELEEM, PEEM etc.))on single crystal surfaces; alkali ion scattering (ISS) for structural analysis of surfaces; field ion microscopy (FIM) of single atoms and clusters;...13 KB (1,651 words) - 19:31, 31 March 2024
Optical microscope (redirect from Optical microscopy)microscope (SEM) Scanning ion-conductance microscopy (SICM) Scanning tunneling microscope (STM) Transmission electron microscopy (TEM) Ultraviolet microscope...52 KB (5,972 words) - 03:47, 11 April 2024- Electrochemistry SECM, scanning electrochemical microscopy SICM, scanning ion-conductance microscopy SVET, scanning vibrating electrode technique SKP...29 KB (3,376 words) - 14:27, 7 May 2024
- electron microscopy [1] was performed with a Philips CM200 FEGST Lorentz electron microscope at an acceleration voltage of 200 kV. For electron microscopy, a
- object to the imaged, and the viewing screen. Field emission microscope Field ion microscope Atom Probe LEED is a technique for imaging surfaces, and has